作者:
C. Richard Brundle,Charles A. Evans, Jr[主编]著
|
C. Richard Brundle,Charles A. Evans, Jr[主编]编
|
C. Richard Brundle,Charles A. Evans, Jr[主编]译
|
C. Richard Brundle,Charles A. Evans, Jr[主编]绘
作者:
C. Richard Brundle,Charles A. Evans, Jr[主编]著|C. Richard Brundle,Charles A. Evans, Jr[主编]编|C. Richard Brundle,Charles A. Evans, Jr[主编]译|C. Richard Brundle,Charles A. Evans, Jr[主编]绘
出版社:哈尔滨工业大学出版社
出版时间:2014-01-01
版次:1
印次:1
印刷时间:2014-01-01
页数:211
开本:大32开
ISBN:9787560342795
版权提供:哈尔滨工业大学出版社
作者:C. Richard Brundle,Charles A. Evans, Jr[主编]
著:C. Richard Brundle,Charles A. Evans, Jr[主编]
装帧:平装
印次:1
定价:78.00
ISBN:9787560342795
出版社:哈尔滨工业大学出版社
开本:大32开
印刷时间:2014-01-01
语种:暂无
出版时间:2014-01-01
页数:211
外部编号:8169679
版次:1
成品尺寸:暂无
Preface to the Reissue ofthe Materials Characterization Series Preface to Series Preface to the Reissue of Characterization of Optical Materials Preface Contributors INTRODUCTION PART 1 INFLUENCE OF SURFACEMORPHOLOGYAND MICROSTRUCTURE ON OPTICAL RESPONSE CHARACTERIZATION OF SURFACE ROUGHNESS 1.1 Introduction 1.2 WhatSurfaceRoughnessls 1.3 HowSurfaceRoughness AffctsOpticaIMeasurements 1.4 How Surface Roughness and ScatteringAre Measured 1.5 Characterization ofSelected Surfaces 1.6 Future Difections CHARACTERIZATION OF THE NEAR-SURFACE REGION USING POIARIZATION-SENSITIVE OPTICAL TECHNIUES 2.1 Introduction 2.2 Ellipsometry ExperimentallmplementationsofEllipsometry 29, Analysisof EllipsometryData . MicrostructuralDeterminationsfromEllipsometryData Temperature Dependence ofthe Opticat Properties ofSilicon 34, Determination ofthe Optical Functions ofGlasses Using SE 35, SpectroscopicEllipsometryStudiesofSi02/Si 37, Spectroscopic EllipsometryforComplicatedFilmStrucrures 38, Time-Resolved Ellipsometry 40, Single-WavelengthReal-TimeMonitoringofFilm Growth 41, Multiple-WavelengthReal-TimeMonitoringofFilm Growth 42, Infrared EllipsometryStudies ofFilm Growth THE COMPOSITION, STOICHIOMETRY, AND RELATED MICROSTRUCTURE OF OPTICAL MATERIALS 3.1 Introduction 3.2 AspectsofRamanScattering 3.3 III-VSemiconductor Systems 3.4 GroupIVMaterials 3.5 Amorphous and Microcrystalline Semiconductors ChalcogenideGlasses 60, GroupIVMicrocrystallineSemiconductors 3.6 Summary DIAMOND AS AN OPTICAL MATERIAL 4.1 Introduction 4.2 DepositionMethods 4.3 0pticalPropertiesofCVD Diamond 4.4 Defectsin CVD Diamond 4.5 PolishingCVD Diamond 4.6 X-rayWindow 4.7 Summary PART 2 STABILITY AND MODIFICATION OF FILM AND SURFACE OPTICAL PROPERTIES MULTIJAYER OPTICAL COATINGS 5.1 Introduction 5.2 Single-LayerOpticalCoatings OpticaIConstants 90, CoitionMeasurementTechniques 5.3 MultilayerOpticalCoatings CoitionaIAnalysis 107, SurfaceAnalyticaITechniques 108, MicrostructuralAnalysis ofMultilayer Optical Coatings 5.4 StabilityofMultilayerOpticalCoatings 5.5 Future Coitional and MicrostructuralAnalyticaITechniques CHARACTERIZATION AND CONTROL OF STRESS IN OPTICAL FILMS 6.1 Introduction 6.2 0rigins ofStress ……