全新正版有机薄膜的表征9787560342870哈尔滨工业大学出版社

Preface to the Reissue of the Materials Characterization Series
Preface to
Series
Preface to the Reissue of Characterization of Organic Thin Films
Preface
Contributors
PART Ⅰ： PREPARATION AND MATERIALS
LANGMUIR—BLODGETT FILMS
1.1 Introduction
1.2 L—B Films ofLong—Chain
Compounds
FattyAcids
Amines
Other Long—Chain Compounds
1.3
Cyclic Compounds and Chromophores
1.4 Polymers and Proteins
1.5
Polymerization In Situ
1.6 Alternation Films （Superlattices）
1.7
PotentiaIApplications
SELF—ASSEMBLED MONOIAYERS
2.1 Introduction
2.2
Monolayers of Fatty Acids
. Monolayers of Organosilicon Derivatives
2.4 Monolayers of Alkanethiolates on Metal and Semiconductor Surfaces
2.5 Self—Assembled Monolayers Containing Aromatic Groups
2.6 Conclusions
PARTⅡ： ANALYSIS OF FILM AND SURFACEPROPERTIES
SPECTROSCOPIC ELLIPSOMETRY
3.1 Introduction and Overview
3.2 Theory of Ellipsometry
3.3
Instrumentation
3.4 Determination of Optical Properties
Analysis of
Single Eliipsometric Spectra： Direct Inversion Methods
Analysis of Single
Ellipsometric Spectra： Least— Squares Regression Analysis Method
Analysis of
Multiple Ellipsometric Spectra
3.5 Determination of Thin Film Structure
Thickness Determination for Monolayers
Microstructural Evolution in
Thick Film Growth
3.6 Future Prospects
INFRARED SPECTROSCOPYIN THE
CHARACTERIZATION OF ORGANIC THIN FILMS
4.1 Introduction
Specific Needs
for Characterizing Organic Thin Films
General Prinaples and Capabilities of
Infrared Spectroscopy for Surface and Thin Film Analysis
4.2 ntitative
Aspects
Spectroscopiclntensities
Electromagnetic Fields in Thin Film
Structures
4.3 The Infrared Spectroscopic Experiment
General
Instrumentation
Experimental Modes
Additional Aspects
4.4 Examples
of Applications
Self—Assembled Monolayers on Gold by External Reflection
Octadecylsiloxane Monolayers on SiO2 byTransmission
Langmuir—Blodgett
Films on Nonmetallic Substrates by External Reflection
RAMAN SPECTROSCOPIC
CHARACTERIZATION OF ORGANIC THIN FILMS
5.1 Introduction
5.2
FundamentalsofRaman Spectroscopy
5.3 InstrumentaIConsiderations
5.4
Raman Spectroscopic Approaches for the Characterization ofOrganicThin Films
Integrated OpticaIWaveguide Raman Spectroscopy （IOWRS）
Total Internal
Reflection Raman Spectroscopy
Surface Enhanced Raman Scattering
Normal
Raman Spectroscopy
Resonance Raman Spectroscopy
Plasmon Surface
Polariton Enhanced Raman Spectroscopy
FourierTransform Raman Spectroscopy
Waveguide Surface Coherent Anti—Stokes Raman Spectroscopy（WSCARS）
5.5
Selected Examples of Thin Film Analyses
Raman Spectral Characterization of
Langmuir—Blodgett Layers of Arachidate and Stearate Salts
Raman Spectral
Characterization of Self—Assembled Monolayers of Alkanethiols on Metals
Surface Enhanced Resonance Raman Spectral Characterization of
Langmuir—Blodgett Layers of Phthalocyanines
5.6 Prospects for Raman
Spectroscopic Characterization of Thin Films
SURFACE POTENTIAL
6.1
Introduction
6.2 Origins of the Contact Potential Difference and Surface
Potential
The Work Function
Contact Potential Difference and Surface
Potential
Surface Potential Changes Induced by Adsorbates
6.3
Measurement of Surface Potential
CapacitanceTechniques
Ionizing—ProbeTechnique
6.4 Surface Potentials of OrganicThin Films
Air—Water Interface： Surface Potential of Langmuir Mono— layers
Air—Solidlnterface： Surface Potential of L—B and Related Films
6.5
Conclusions
X—RAY DIFFRACTION
7.1 Introduction
7.2 Basic Principles
7.3 Structure Normal to Film Plane
7.4 Structure Within the Film Plane
7.5 Summary
HIGH RESOLUTION EELS STUDIES OF ORGANIC THIN FILMS AND
SURFACES
8.1 Introduction
8.2 TheScatteringMechanism
DipoleScattering
Impact Scattering
Resonance Scattering
8.3
TheSpectrometer
8.4 EELS Versus Other Techniques： Advantages and
Disadvantages
8.5 Examples
ResolutionEnhancement
Linearity
Depth
Sensitivity
Molecular Orientation
Local Versus Long—Range lnteractions
SurfaceS egregation
8.6 Conclusions
WETTING
9.1 Introduction
9.2 ContactAngles
9.3 Techniques for Contact Angle Measurements
Axisymmetric Drop ShapeAnalysis—Profile （ADSA—P）
Axisymmetric Drop Shape
Analysis—Contact Diameter （ADSA—CD）
Capillary Rise Technique
9.4 Phase
Rule for Moderately Curved Surface Systems
9.5 Equation of State
forInterfacialTensions of Solid— Liquid Systems
9.6 Drop Size Dependence of
Contact Angle and Line Tension
9.7 Contact Angles in the Presence ofa Thin
Liquid Film
9.8 Effects ofElastic Liquid—Vaporlnterfaces on Wetting
SECONDARY ION MASS SPECTROMETRY AS APPLE TO THIN ORGANIC AND POLYMERIC
FILMS
10.1 Introduction and Background
Overview of the SIMS Method and
Experiment
Ion FormationMechanisms
Comparisons to Other Surface Analysis
Techniques
The Motivation for Thin Organic Films as Model Systems
10.2
litative Information： Mechanisms ofSecondary Molecularlon Formation
Structure—Ion Formation Relationships
Applications to Self—Assembled
Film Chemistry
10.3 The Study ofSampling Depth in the SIMS Experiment
10.4 ntitationin SIMS
Development of ntitation Methods
Applicationof ntitative Schemes to Thin Film Chemistry
10.5
ImagingApplications
10.6 Summary and Prospects
X—RAY PHOTOELECTRON
SPECTROSCOPY OF ORGANIC THIN FILMS
11.1 Introduction
11.2 Experimental
Considerations
11.3 Binding Energy Shifts
11.4 XPS of Molten Films
11.5 Angular Dependent XPS
11.6 ETOAXPS of Self—Assembled Monolayers
11.7 Conclusions
MOLECUlAR ORIENTATION IN THIN FILMS AS PROBED BY
OPTICAL SECOND HARMONIC GENERATION
12.1 Introduction
12.2 Experimental
Considerations
1. Molecular Nonlinear Polarizabiliry Calculation
12.4
Measurements of the Surface Nonlinear Susceptibility
12.5 Molecular
Orientation Calculation
Casel：βzzzonly
Case2：βzxxonly
Case3：
βxxz（=βxzx）only
Case4：βzzz and βzxx
Case5： βzxx and βxxz（=βxzx）
12.6
Absolute Molecular Orientation Measurements
12.7 Summary and Conclusions
APPENDIX： TECHNIUE SUMMARIES
I Auger Electron Spectroscopy（AES）
2
DynamicSecondarylon Mass Spectrometry （DynamicSIMS） 252
3
FourierTransformlnfraredSpectroscopy（FTIR） 253
4 High—Resolution Electron
Energy Loss Spectroscopy （HREELS）
5 Low—Energy Electron Diffraction（LEED）
6 Raman Spectroscopy
7 Scanning Electron Microscopy（SEM）
8 Scanning
Tunneling Microscopy（STM） and Scanning Force Microscopy （SFM）
9 Static
Secondarylon Mass Spectrometry （Static SIMS）
10 Transmission Electron
Microscopy（TEM）
11 Variable—Angle Spectroscopic Ellipsometry（VASE）
12
X—Ray Diffraction XRD）
13 X—Ray Fluorescence（XRF）
14 X—Ray Photoelectron
Spectroscopy（XPS）
Index 

近几十年，研究有机薄膜的分析技术经历了引人注目的发展。使用这些技术能够在分子级水平获得结构信息，这样就可以将材料结构与材料质联系起来。有机薄膜表征一书可以帮材料科学家、物理学家、化学家及生物学家对结构与材料的关系有一个基础理解，这反过来也可以使材料的分子工程变为可能并且在分子制造领域开创新机会。《有机薄膜的表征》(作者布伦德尔、埃文斯、乌尔曼)以关于Langmuir—Blodgett与自组装膜的介绍章节作为开始，接着讨论了利用不同分析技术研究其质，表面/界面与体特都包含其中。